Polarization axis fluctuations in a single mode VCSEL laser at 780nm

Grzegorz Dudzik, Janusz Rzepka

Abstract


We present a transmission method to determine the polarization axis fluctuations for VCSEL (Vertical Cavity Surface Emitting Laser). The research is focused mainly on commercial lasers operatingat 780 nm, designed forlaser spectroscopy. The angle fluctuation of the laser linear axis polarization iselaborated to be less than 150 mrad. Measurement errors of this method are studied and calculated. The measurement uncertainty is ?1,4 mrad andthis is equivalent to ? 5? of arc.Changes of the linear polarization axis depending on the laser current and temperaturearepresented. 

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Photonics Letters of Poland - A Publication of the Photonics Society of Poland
Published in cooperation with SPIE

ISSN: 2080-2242