Investigation of parameters of the multimode four-layer waveguide structures and their influence on the light propagation
AbstractIn the paper investigation of multimode four-layer waveguide structures by modified m-line spectroscopy method was presented. Waveguide layers with a gradient profile of the refractive index were prepared by the ion-exchange method. Dielectric layers were deposited on the waveguide by the spin-coating method. The investigation was aimed at learning the influence of parameters of the waveguide layer and the thin layer deposited on the waveguide on the propagation of light in this waveguide.
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- R. Ulrich R. Torge,"Measurement of Thin Film Parameters with a prism coupler", Applied Optics 12, 2901 (1973)[CrossRef]
- E. Auguściuk, F. Sala,"Application of planar waveguide with gradient index profile to determine parameters of thin active layers used in waveguide sensor", Proc. of SPIE vol. 6585, D1 (2007)[CrossRef]
- E. Auguściuk,"Multilayer waveguide structures investigated by the generalized m-line spectroscopy", Proc. SPIE vol. 7120, 71200J (2008)[CrossRef]
How to Cite
E. Auguściuk and G. Biniecki, “Investigation of parameters of the multimode four-layer waveguide structures and their influence on the light propagation”, Photonics Lett. Pol., vol. 1, no. 3, pp. pp. 124–126, Sep. 2009.