Auguściuk, Elżbieta, and Bartłomiej Bogdanowicz. “Thickness Control of Thin Dielectric Layers by the Generalized M-Line Spectroscopy Method”. Photonics Letters of Poland, vol. 2, no. 2, June 2010, pp. pp. 70-72, doi:10.4302/photon. lett. pl.v2i2.116.