AUGUŚCIUK, Elżbieta; BOGDANOWICZ, Bartłomiej. Thickness control of thin dielectric layers by the generalized m-line spectroscopy method. Photonics Letters of Poland, [S. l.], v. 2, n. 2, p. pp. 70–72, 2010. DOI: 10.4302/photon. lett. pl.v2i2.116. Disponível em: https://www.photonics.pl/PLP/index.php/letters/article/view/2-24. Acesso em: 26 apr. 2024.