@article{Drewniak_Pustelny_Pasternak_Krajewska_Konieczny_2014, title={Study of Morphology of Graphene using Atomic Force Microscopy and Raman Spectroscopy}, volume={6}, url={https://www.photonics.pl/PLP/index.php/letters/article/view/6-42}, DOI={10.4302/photon. lett. pl.v6i4.527}, abstractNote={This paper presents the analysis of graphene layer imposed on the resistance sensing structure. All the studies are directed to determine the quantity and quality of the graphene layer. We present the results of the experiments using atomic force microscopy, electron microscopy and Raman spectroscopy. The Raman spectra were subjected to detailed analyzes, especially a position and a half width of 2D peak. <br /> <br /> Full Text: <a class="file" href="/PLP/index.php/letters/article/view/6-42/362" target="_parent">PDF</a> <br /> <br /> <strong>References</strong> <ol> <li> T. Pustelny, M. Setkiewicz, S. Drewniak, E. Maciak, A. Stolarczyk, M. Urbańczyk, M. Procek, K. Gut, Z. Oplski, I. 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